클라이언트: National Instruments Corporation (U.K.) Ltd
양식: 백서
크기: 5.47MB
언어: 영어
날짜: 29.05.2019

Engineer's Guide to 5G Semiconductor Test

Wideband 5G IC test is complex. The Engineer’s Guide to 5G Semiconductor Test is here to help. A must-read for anyone navigating the time, cost and quality trade-offs of sub-6 GHz and mmWave IC test, the guide features color diagrams, recommend test procedures and tips for avoiding common mistakes. Topics include:

• Working with wide 5G Downlink and Uplink OFDM waveforms 
• Configuring wideband test benches for extensive frequency coverage 
• Common sources of error in 5G beamforming 
• Reducing test times of Over-the-air TX and RX test procedures 
• Alternative to RF chambers for high volume production for mmWave RFICs

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Date: 1.8.2018

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