客戶: National Instruments Corporation (U.K.) Ltd
格式: 白皮書
尺寸: 5.47 MB
語言: 英語
日期: 05.08.2019

Engineer’s Guide to 5G Semiconductor Test

Wideband 5G IC test is complex. The Engineer’s Guide to 5G Semiconductor Test is here to help. A must-read for anyone navigating the time, cost and quality trade-offs of sub-6 GHz and mmWave IC test, the guide features color diagrams, recommend test procedures and tips for avoiding common mistakes.

Topics include:

  • Working with wide 5G Downlink and Uplink OFDM waveforms
  • Configuring wideband test benches for extensive frequency coverage
  • Common sources of error in 5G beamforming
  • Reducing test times of Over-the-air TX and RX test procedures
  • Alternative to RF chambers for high volume production for mmWave RFICs

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    Date: 1.8.2018

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