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Client: National Instruments Corporation (U.K.) Ltd
Format: Whitepaper
Size: 5.47 MB
Language: English
Date: 29.05.2019
Engineer's Guide to 5G Semiconductor Test
Wideband 5G IC test is complex. The Engineer’s Guide to 5G Semiconductor Test is here to help. A must-read for anyone navigating the time, cost and quality trade-offs of sub-6 GHz and mmWave IC test, the guide features color diagrams, recommend test procedures and tips for avoiding common mistakes. Topics include:
• Working with wide 5G Downlink and Uplink OFDM waveforms
• Configuring wideband test benches for extensive frequency coverage
• Common sources of error in 5G beamforming
• Reducing test times of Over-the-air TX and RX test procedures
• Alternative to RF chambers for high volume production for mmWave RFICs